Surface Metrology Catalog For Semiconductors and Manufacturi


The Corning Tropel UltraSort represents the State Of The Art in automated semiconductor wafer measurement, and continues a 25 year tradition of providing metrology solutions to semiconductor manufacturers. Designed specifically for high volume wafer manufacturing, this automated system offers the utmost in rapid, repeatable, accurate non-contact verification of many substrate materials in the field.

Learn more about the Tropel UltraSort.